Atomic force microscopy (AFM) is a powerful technique for nanoscale characterization of material surfaces. Although mainly known for its high-resolution topographical images and roughness analysis, AFM has evolved over the years into an advanced characterization tool capable of probing several surface properties.

At the nanocharacterization laboratory at ICFO, a broad range of techniques are available to users for the study of the surface properties across different material systems, including different operational modes that enable the investigation of local conductivity, ferroelectricity, adhesion and thermal transport, among others.
In this seminar, I will provide an overview of the different AFM modes implemented at ICFO, explaining the physics behind each technique and highlighting its main applications, illustrating how AFM enables comprehensive nanoscale characterization beyond simple imaging.